CleanMill Broad Ion Beam System

High-quality observation and characterization of materials often require an artifact-free surface, which can be difficult to achieve with traditional polishing techniques like grinding or mechanical polishing.

The Thermo Scientific™ CleanMill Broad Ion Beam System is a complete ion beam polishing solution for SEM applications in materials science, enabling optimal imaging and analysis of materials where a pristine surface is required, including beam- and air-sensitive materials.

The CleanMill System is fully compatible with the Thermo Scientific™ CleanConnect Sample Transfer System, making it easy to quickly transfer samples between instruments while minimizing sample handling.

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CleanMill 宽离子束系统的特征

高能离子源

超高能量离子枪的最大加速电压为 16 kV，可对样本表面进行快速铣削和抛光。

超精细表面抛光

CleanMill 系统可配置选配的低能量离子枪，用于对样本表面进行最终抛光。

宽广的加速电压

该系统可提供 2 kV 至 16 kV 的离子能量范围，，并具有专用光学元件，用于从100 V 至 2 kV 的超低电压抛光。

CleanConnect 系统兼容性

使用 Thermo Scientific IGST（惰性气体样本转移）工作流程将样本从 CleanMill 系统可靠地转移至显微镜腔室，可用于观察天然状态下的材料。

实时监测

集成式触摸屏和高分辨率相机可帮助您跟踪宽离子束铣削过程。

低温铣削

选配的冷冻载物台可实现 LN2冷却，具有自动再填充功能，可处理对离子束特别敏感的材料。